Imaging via Cosmic Muon Induced Secondaries
Abstract
As cosmic muons traverse a target, they interact with it, producing secondary radiation, whose spectrum
depends on the material-composition of the target. This imaging technique is sensitive to low-Z materials
as well, opening a novel noninvasive material-identification method for medium-sized obscure targets.
Our Hungarian-Serbian collaboration pioneered in demonstrating experimentally this unique method, using
gaseous trackers for the muons and a scintillator array and germanium detector for the secondaries.
Results have proven imaging possibilities ranging from metals to soft-tissue targets. Corresponding Geant4
simulations have revealed forward-sideward asymmetry and sensitivity to the electron/gamma ratio. The
former is materialized in a new experimental setup, with large coverage via segmented scintillator arrays,
and a combined and compact DAQ, with an electron-tagging possibility. The paper describes the recent
results in imaging via secondaries and details the new enhanced experimental setup and its first results.
Journal of Advanced Instrumentation in Science (JAIS) is an open access journal published by Andromeda Publishing and Education Services. The articles in JAIS are distributed according to the terms of the creative commons license CC-BY 4.0. Under the terms of this license, copyright is retained by the author while use, distribution and reproduction in any medium are permitted provided proper credit is given to original authors and sources.
Terms of Submission
By submitting an article for publication in JAIS, the submitting author asserts that:
1. The article presents original contributions by the author(s) which have not been published previously in a peer-reviewed medium and are not subject to copyright protection.
2. The co-authors of the article, if any, as well as any institution whose approval is required, agree to the publication of the article in JAIS.